Administracja Centralna Uczelni - Wymiana międzynarodowa (S1)
Sylabus przedmiotu Fundamentals of crystallography and diffraction methods:
Informacje podstawowe
| Kierunek studiów | Wymiana międzynarodowa | ||
|---|---|---|---|
| Forma studiów | studia stacjonarne | Poziom | pierwszego stopnia |
| Tytuł zawodowy absolwenta | |||
| Obszary studiów | — | ||
| Profil | |||
| Moduł | — | ||
| Przedmiot | Fundamentals of crystallography and diffraction methods | ||
| Specjalność | przedmiot wspólny | ||
| Jednostka prowadząca | Katedra Chemii Nieorganicznej i Analitycznej | ||
| Nauczyciel odpowiedzialny | Piotr Tabero <Piotr.Tabero@zut.edu.pl> | ||
| Inni nauczyciele | Monika Bosacka <Monika.Bosacka@zut.edu.pl>, Anna Błońska-Tabero <Anna.Blonska-Tabero@zut.edu.pl>, Grażyna Dąbrowska <Grazyna.Dabrowska@zut.edu.pl>, Elżbieta Filipek <Elzbieta.Filipek@zut.edu.pl>, Piotr Tabero <Piotr.Tabero@zut.edu.pl>, Elżbieta Tomaszewicz <Elzbieta.Tomaszewicz@zut.edu.pl> | ||
| ECTS (planowane) | 4,0 | ECTS (formy) | 4,0 |
| Forma zaliczenia | zaliczenie | Język | polski |
| Blok obieralny | — | Grupa obieralna | — |
Formy dydaktyczne
Wymagania wstępne
| KOD | Wymaganie wstępne |
|---|---|
| W-1 | Fundamentals of mathematics, physics and chemistry |
Cele przedmiotu
| KOD | Cel modułu/przedmiotu |
|---|---|
| C-1 | To acquaint students with the fundamentals of crystallography |
| C-2 | To acquaint students with methods of generation and properties of X-rays |
| C-3 | To acquaint students with the measuring techniques using diffraction phenomenon and their practical applications |
| C-4 | To teach students how to use stuctural data gained from diffraction measurements, available structural datebases and literature. |
Treści programowe z podziałem na formy zajęć
| KOD | Treść programowa | Godziny |
|---|---|---|
| ćwiczenia audytoryjne | ||
| T-A-1 | Definition of crystalline body. Sructure of ideal solid. Morphology of crystals. Analysis and description of real objects: crystal, single crystal, twinns, intergrowths of crystals, policrystalline substance, amorphous substance, sand, gravel, silt, rock, mineral and solid. | 2 |
| T-A-2 | Atomic and ionic radii. Coordination polyhedra. Connection of polyhedra. Crystal systems. Simple structures of elements and compounds: SC, BCC, FCC and HCP lattices. | 2 |
| T-A-3 | Symmetry in crystals.Point groups and space groups. International Tables for Crystallograhy. | 2 |
| T-A-4 | Structure and properties of solids. Cleavage, hardness. Defects in crystal structure. Solid solutions, their properties and application. | 2 |
| T-A-5 | Generation and properties of of X-rays. Interaction of X-Rays with matter. Diffraction grating. X-ray diffraction on crystals. | 2 |
| T-A-6 | Laue equation and Bragg equation. Intensity of diffraction reflections. Powder X-ray diffraction (PXRD). Preparation of samples for PXRD investigtions. Energy dispersive X-ray diffraction (EDXRD). | 2 |
| T-A-7 | Preferred orientation of crystallites. Qualitative X-ray phase analysis. Identification of metals and alloys. Identification of minerals and components of rocks and sands from different locations. | 4 |
| T-A-8 | Indexation of powder diffracion patterns. Lattice parameter determination. Measurement of density. Rentgenographic density. | 4 |
| T-A-9 | Determination of grain size, internal stress and lattice distortions. Quanntitative X-Ray phase analysis. | 2 |
| T-A-10 | X-ray high-temperature measurements. Determination of coefficients of thermal expansion. Anisotropy of thermal expansion. Investigations of plymorphic phase transitions. | 2 |
| T-A-11 | Nanocrystalline, semicrystalline and amorphous materials- properties and investigation. Liquid crystals. Mesoporous molecular sieves. | 2 |
| T-A-12 | Structure solution from powder diffraction. Rietveld refinement. Structure solution from single crystals. Diffraction of electrons and neutrons. | 4 |
| 30 | ||
| wykłady | ||
| T-W-1 | Early historical notes. Basic definitions in crystallography. Solids. Physical properties of solids. Structure of "ideal" solid. Morphology of crystals. | 2 |
| T-W-2 | Crystal systems and Bravais lattices. Symmetry in crystals. Point groups and space groups. International Tables for Crystallography | 2 |
| T-W-3 | Atomic and ionic radii. Coordination polyhedra. Simple structures of elements and compounds: SC, BCC , FCC and HCP lattices. | 2 |
| T-W-4 | Structure and properties of solids. Defect in crystal structure. Solid solutions. | 2 |
| T-W-5 | Generation and properties of X-rays. Interaction of X-rays with matte. Safety procedures for x-ray equipment. X-ray diffraction on solids. | 2 |
| T-W-6 | Laue equation and Bragg Law. Intensity of diffraction reflections. | 2 |
| T-W-7 | Powder X-ray diffraction (PXRD). Energy-dispersive X-ray diffraction (EDXRD). Single crystal X-ray diffraction. | 2 |
| T-W-8 | Qualitative XRD phase analysis. Preferred orientation of crystallites. X-ray techniques for texture investigations. | 2 |
| T-W-9 | Quantitative X-ray phase analysis. Measurements of thickness of thin layers. | 2 |
| T-W-10 | Lattice defects and diffraction pattern. Investigation of size of crystallites , internal stresses and lattice distortions. Rentgenographic density. | 2 |
| T-W-11 | High-temperature , low-temperature and high-pressure XRD measurements. Investigation of polimorphic phase transitions and thermal expansion. | 2 |
| T-W-12 | Nanocrystalline, semicrystalline and amorphous materials. Liquid crystals. Mesoporous molecular sieves. | 1 |
| T-W-13 | Indexation of powder diffraction patterns. Precise determination of the unit cell parameters. | 2 |
| T-W-14 | Structure solution from single crystals. Structure solution from powder patterns. Rietveld refinement. | 2 |
| T-W-15 | XRD vs neutron and electron diffraction | 1 |
| T-W-16 | The final written test | 2 |
| 30 | ||
Obciążenie pracą studenta - formy aktywności
| KOD | Forma aktywności | Godziny |
|---|---|---|
| ćwiczenia audytoryjne | ||
| A-A-1 | Participation in workshop | 30 |
| A-A-2 | Participation in consultations | 2 |
| A-A-3 | Self-study of literature | 12 |
| A-A-4 | Preparation of written reports | 16 |
| 60 | ||
| wykłady | ||
| A-W-1 | Participation in lectures | 30 |
| A-W-2 | Participation in consultations | 2 |
| A-W-3 | Self-study of literature | 12 |
| A-W-4 | Preparing to pass written test based on the indicated literature and other sources of knowledge | 14 |
| A-W-5 | Finnal written exam | 2 |
| 60 | ||
Metody nauczania / narzędzia dydaktyczne
| KOD | Metoda nauczania / narzędzie dydaktyczne |
|---|---|
| M-1 | Informative lectures with multimedia instruments, explanation |
| M-2 | Work with computers and dedicated software |
Sposoby oceny
| KOD | Sposób oceny |
|---|---|
| S-1 | Ocena podsumowująca: Final written exam |
| S-2 | Ocena podsumowująca: written reports |
Zamierzone efekty kształcenia - wiedza
| Zamierzone efekty kształcenia | Odniesienie do efektów kształcenia dla kierunku studiów | Odniesienie do efektów zdefiniowanych dla obszaru kształcenia | Cel przedmiotu | Treści programowe | Metody nauczania | Sposób oceny |
|---|---|---|---|---|---|---|
| WM-WTiICh_1-_null_W01 Student knows fundamental concepts in crystallography and knows measuring techniques using diffraction phenomenon | — | — | C-1, C-2, C-3 | — | M-1 | S-1 |
Zamierzone efekty kształcenia - umiejętności
| Zamierzone efekty kształcenia | Odniesienie do efektów kształcenia dla kierunku studiów | Odniesienie do efektów zdefiniowanych dla obszaru kształcenia | Cel przedmiotu | Treści programowe | Metody nauczania | Sposób oceny |
|---|---|---|---|---|---|---|
| WM-WTiICh_1-_null_U01 Students is able to select appropriate diffraction measuring technique to investigate given property of material and interpret obtained results of investigation | — | — | C-1, C-2, C-3 | — | M-1 | S-1 |
Zamierzone efekty kształcenia - inne kompetencje społeczne i personalne
| Zamierzone efekty kształcenia | Odniesienie do efektów kształcenia dla kierunku studiów | Odniesienie do efektów zdefiniowanych dla obszaru kształcenia | Cel przedmiotu | Treści programowe | Metody nauczania | Sposób oceny |
|---|---|---|---|---|---|---|
| WM-WTiICh_1-_null_K01 Student knows safety procedures for x-ray equipment and understands importance of permanent learning to improve personal competencies | — | — | C-1, C-2, C-3 | — | M-1 | S-1 |
Kryterium oceny - wiedza
| Efekt kształcenia | Ocena | Kryterium oceny |
|---|---|---|
| WM-WTiICh_1-_null_W01 Student knows fundamental concepts in crystallography and knows measuring techniques using diffraction phenomenon | 2,0 | |
| 3,0 | Student will be able to present basic concepts of crystallography and describe basic measuring methods applying X-ray diffraction. | |
| 3,5 | ||
| 4,0 | ||
| 4,5 | ||
| 5,0 |
Kryterium oceny - umiejętności
| Efekt kształcenia | Ocena | Kryterium oceny |
|---|---|---|
| WM-WTiICh_1-_null_U01 Students is able to select appropriate diffraction measuring technique to investigate given property of material and interpret obtained results of investigation | 2,0 | |
| 3,0 | Student will be able to select approprate XRD measuring technique to solve simple problem concerning analysis of crystalline solid | |
| 3,5 | ||
| 4,0 | ||
| 4,5 | ||
| 5,0 |
Kryterium oceny - inne kompetencje społeczne i personalne
| Efekt kształcenia | Ocena | Kryterium oceny |
|---|---|---|
| WM-WTiICh_1-_null_K01 Student knows safety procedures for x-ray equipment and understands importance of permanent learning to improve personal competencies | 2,0 | |
| 3,0 | Student knows and understands safety procedures for x-ray equipment | |
| 3,5 | ||
| 4,0 | ||
| 4,5 | ||
| 5,0 |
Literatura podstawowa
- C. Giacovazzo, H. Z. Monaco, D. Biterbo, F. Scordari, G. Gilli, G. Zanotti, M. Catti, Fundamentals of Crystallography, IUCR, Oxford University Press, Oxford, 2000
- D. B. Williams, C. B. Carter, Transmission Electron Microscopy, Plenum Press, New York and London, 1996
- O. Engler, V. Randle, Introduction to Texture Analysis. Macrotexture, Microtexture and Orientation Mappin, CRC Press, Taylor & Francis Group, Boca Raton, London, New York, 2010
- Cullity B.D., Elements of X-ray Diffraction, Addison-Wesley Publishing Company, Inc., London, 1978
- P. Luger, Modern X-ray Analysis on Single Crystals, Walter de Gruyter and Co., Berlin, 1980
- J. P. Glusker, M. Lewis, M. Rossi, Crystal Structure Analysis for Chemists and Biologists, VCH, New York, 1994
- W.I.F. David, K. Shankland, L.B. McCusker and Ch. Baerlocher, Edt., Structure determination form powder diffraction data. IUCr Monographs on crystallography, Oxford Science Publications, Oxford, 2002
- A. Gaunier, X-ray Diffraction in Crystals, Imperfect Crystals, and Amorphous Bodies, Courier Corporation, New York, 1994
- A. AUTHIER, G. CHAPUIS, EDS, A LITTLE DICTIONARY OF CRYSTALLOGRAPHY, INTERNATIONAL UNION OF CRYSTALLOGRAPHY, 2017, 2ND EDITION
- P. P. Ewald, Ed., Fifty Years of X-ray Diffraction, Reprinted in pdf format for the IUCr XVIII Congress, Glasgow, Scotland, Copyright © 1962, 1999 International Union of Crystallography, https://www.iucr.org, 1999
Literatura dodatkowa
- http://www.xtal.iqfr.csic.es/Cristalografia/parte_01_1-en.html
- International Union of Crystallography: https://www.iucr.org